GCIB-SIMS for the analysis of clinical samples
October 23, 2025 @ 15:00 – 16:00 CEST
This month’s Mass Spectrometry Imaging webinar will introduce the principles of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) imaging using a Gas Cluster Ion Beam (GCIB) as the primary ion source. The seminar will cover the fundamentals, capabilities, and key applications of this powerful technique, with a special focus on its use in clinical research.
🕒 Time: 15:00–16:00 (presentation and discussion)
☕ Followed by: Informal discussion with the speaker, 16:00–16:30
📍 Format: Zoom
Speaker
Prof. John Fletcher is a leading expert in secondary ion mass spectrometry (SIMS) imaging, particularly in developing methods for biological and clinical applications. He studied Chemistry at the University of Manchester Institute of Science and Technology (UMIST) and completed his PhD in 2004 under Prof. John Vickerman. After several years of research at the University of Manchester—spanning atmospheric science, instrument development, and bioimaging—he moved to Sweden in 2012. Prof. Fletcher is now Professor of Analytical Chemistry at the University of Gothenburg, where his research focuses on applying advanced mass spectrometry imaging techniques to life science.
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