Advanced multimodal nano-analytical capabilities on FIB instruments using SIMS: new developments, applications and prospects
March 25, 2026 @ 15:00 – 16:00 CET
This month’s Mass Spectrometry Imaging webinar introduces the development of an advanced multimodal imaging approach at nanoscale resolution, integrating techniques such as focused ion beam imaging, helium ion microscopy, transmission electron microscopy, scanning probe microscopy, and NanoSIMS. Applications across a range of research areas will be presented.
🕒 Time: 15:00–16:00 (presentation and discussion)
☕ Followed by: Informal discussion with the speaker, 16:00–16:30
📍 Format: Zoom
Meeting ID: 615 5936 0769
Passcode: 338971
About the speaker
Dr. Tom Wirtz is Head of Unit for Scientific Instrumentation and Process Technology (SIPT) at the Luxembourg Institute of Science and Technology (LIST). He is the author or co-author of 160 peer-reviewed articles and holds 13 patents.
His research focuses on nano-analytics, combining high lateral resolution with highly sensitive chemical analysis through correlative approaches. Examples include the in situ integration of secondary ion mass spectrometry with focused ion beam (FIB) instruments, helium ion microscopy, transmission electron microscopy, and scanning probe microscopy.
Speaker
Schematic overview of the different FIB techniques. See Roadmap for focused ion beam technologies, Appl. Phys. Rev. 10, 041311
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