Umeå seminar series: Discover your sample in 3D using volume EM by FIB-SEM
April 29, 2025 @ 12:00 – 13:00 CEST
Presenter: Sara Henriksson, Staff scientist, Umeå Centre for Electron Microscopy (UCEM), Umeå University
Abstract: FIB-SEM is a conventional scanning electron microscope equipped with a focused ion beam. This beam is destructive which enables shaping of objects inside of the microscope. Such a microscope can act as a knife, removing section by section of a sample. Together with high-quality sample preparation and electron detectors, this facilitates a volumetric view of any given sample at high magnification and resolution. This seminar will describe the method in more detail and give examples of supported projects and applications.
REGISTRATION
Sign up for the IRL seminar on the 29th of April and reserve your free lunch (salad, drink, and a little sweet snack) by Friday, 25th April, 13:30 in the form below, or follow online here: https://www.umu.se/en/research/groups/scilifelab/scilifelab-site-umea–kbc-infrastructure-seminar-series/
Google Calendar 
