Umeå seminar series: Discover your sample in 3D using volume EM by FIB-SEM
Presenter: Sara Henriksson, Staff scientist, Umeå Centre for Electron Microscopy (UCEM), Umeå University Abstract: FIB-SEM is a conventional scanning electron microscope equipped with a focused ion beam. This beam is destructive which enables shaping of objects inside of the microscope. Such a microscope can act as a knife, removing section by section of a sample. Together with […]